Tektronix THDP0100 Differential Probe; 100 Mhz TEKPI Differential High Voltage Probe THDP0100
Tektronix THDP0100 Differential Probe; 100 Mhz TEKPI Differential High Voltage Probe
Capture every detail of high-speed serial standards with the Tektronix THDP0100 Differential Probe. Designed for high voltage differential signaling, this probe delivers industry-leading bandwidth and signal fidelity. Ideal for characterizing high-speed serial interfaces, it ensures accurate measurement and analysis. With a 100 MHz bandwidth, it can handle the most demanding applications. The THDP0100 is perfect for engineers working on high-speed serial standards such as PCIe, SATA, and USB. Its high accuracy and reliability make it an essential tool for R&D, design validation, and production testing. Get precise measurements and improve your design with the Tektronix THDP0100 Differential Probe.
Top product features:
- Differential signaling used in high speed serial standards requires very accurate characterization.
- The probe ensures that you see every possible detail.
- Industry-leading bandwidth and signal fidelity are found in the probe.
Top product applications:
- High-speed serial data acquisition
- Characterizing high-speed serial interfaces such as PCIe, SATA, and USB
- Measuring high-frequency differential signals in applications like automotive and industrial control systems
Tektronix thdp0100 differential probe; 100 mhz tekpi differential high voltage probe series description differential signaling used in high speed serial standards requires very accurate characterization. The industry-leading bandwidth and signal fidelity found in a tektronix differential probe ensures that you see every possible detail.
Additional Information
- UNSPSC: 41111930
- Brand: Tektronix
- Package Quantity: 1
- Country of Origin: CN
- FOB Origin: MA
- Ships by: PARCEL
- Comes in a kit: No
- Newly added to catalog: No
- Item is on Clearance: No
- Contains Hazardous Materials: No
- CA Proposition 65 Applies: No
- Package Weight: 5.00
Product info last updated on February 18, 2026 12:54pm UTC
Category: Electrical Power Testing