Metal-In Static Shielding Bag, 3x3in, PK100 MPN:30033
Metal-In Static Shielding Bag, 3x3in, PK100
Protect sensitive electronics from static damage with our Metal-In Static Shielding Bags. These 3x3 inch bags feature a metal interior and static dissipative coating to absorb and discharge static electricity, ensuring safe storage and transport of components. Ideal for use in manufacturing, assembly, and shipping of electronics, these bags provide reliable protection against static-related damage. The silver-colored bags are easy to seal with a zip lock and can withstand high temperatures, making them perfect for use in cleanrooms, assembly lines, and shipping departments. Order in packs of 100 for a reliable and cost-effective solution.
Top product features:
- Static dissipation coating for safe handling of sensitive electronics
- Zip seal closure for secure and easy opening and closing of the bag
- Interior metal surface for effective shielding of electromagnetic energy
Top product applications:
- Static protection of sensitive electronic components during shipping and storage
- Electrostatic discharge (ESD) protection of medical devices and equipment
- Shielding of sensitive electronic components in laboratory settings
Static Shielding Bag, Width 3 in, Length 3 in, Thickness 0.0028 in, Coating Static Dissipative, Color Silver, Reclosable, Bag Closure Type Zip Seal, Discharge Shielding Energy Test 10 nJ, FDA Compliant No, Seal Strength 11 lbf, Heat Seal Recommended Temperature 300 Degrees to 375 Degrees F, Metal-In/Metal-Out Metal Interior, Bag Package Configuration Flat Pack, Puncture Strength 12 lbf, Exterior Surface Resistance 100,000,000,000 ohm, Interior Surface Resistance 10,000 to 100,000,000,000 ohm
Additional Information
- Country of Origin: US
- Drop Ship Item: No
- Blind Ship Eligible: No
- LTL Freight Required: No
- Lead Time: Ships in 1 days
- Minimum Order Quantity: 1
- Unit of Measure: PK
- Package Length: 7.00
- Package Width: 4.10
- Package Height: 1.50
- Package Weight: 0.43
Product info last updated on February 11, 2026 6:08am UTC
Category: Electronic and Bench Testing